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Yokogawa releases probes for power measurement

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High-voltage, wide-bandwidth differential probes target waveform observation of switching signals from SiC chips, IGBTs, and GaN devices

Yokogawa Test & Measurement has released a new series of wide-bandwidth differential probes that can measure voltages over 1000 V and offer a wide frequency range from DC to 400 MHz.

Applications include precision evaluation of high-speed, high-voltage switching signals exhibited by SiC devices and IGBTs within EV inverters, and

power analysis and operational confirmation of SiC and GaN based power electronics.

According to the company, the new probes will be particularly beneficial for developers of next-generation inverters, enabling the accurate observation of tiny changes in high-speed switching signals. In addition, excellent noise resistance allows the detection of events that can cause unexpected anomalies, including waveform overshoot and ringing.

The probes use the Yokogawa probe interface, and do not need an external power supply when connected to a Yokogawa oscilloscope.

Initially, two models of the new PBDH0400 series will be available: the 702922 model with a maximum input voltage of 2000 V, and the 702921 with a maximum input voltage of 1000 V.


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