VIDEO
SMU optimised for testing emerging nano/2D semiconductor devices
Video Summary
Chuck Cimino, Senior Product Manager for Lake Shore Cryotronics, explains the company’s new test instrument optimised for characterizing nanoscale and other low-power semiconductor devices. The new SMU-10 Source Measure Unit expands the module offering of Lake Shore’s MeasureReady M81-SSM Synchronous Source Measure (SSM) System and enables engineers to easily source and measure signals that would otherwise be swamped by electrical noise. Primary applications include I-V characterization of transistors used in specialized sensors, nanoelectromechanical systems (NEMS), quantum computer readout electronics, and emerging specialized and integrated circuit nanoscale semiconductor-based devices.
