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Monday 30th November 2015
Expanded nk database and advanced analysis for GaN/SiC-4H HEMTs
Monday 30th November 2015
Chemical imaging combined with Dimension Icon tool sets new standard in surface characterisation
Monday 30th November 2015
EpiCurve TT used to monitor surface roughness, growth rate and wafer bowing.
Monday 30th November 2015
Chinese compound semiconductor foundry will provide Calibre design rule decks to customers 
Wednesday 25th November 2015
Losses in power converters could be halved
Tuesday 24th November 2015
Infineon Technologies AG continues to improve IGBT performance with the release of the new S5 (S for soft) family.
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Monday 23rd November 2015
SiC JFET switch and pulsed LED included in 2015 ‘Oscars of invention’
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Thursday 19th November 2015
San Antonio analogue fab to support strong demand and provide manufacturing flexibility
Tuesday 17th November 2015
Automotive and defence applications driving demand
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Friday 13th November 2015
ALL-Switch samples and evaluation boards delivered to key customers
Friday 6th November 2015
New GaN-on-SiC process provides targets 4G-5G macro-cell basestation applications

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