News Article

Keysight Announces Dynamic Power Analyser For WBG Devices


Delivers consistent, reliable characterisation of wide-bandgap semiconductors, ensures a safe test environment

Keysight Technologies has announced a new dynamic power device analyser with double-pulse tester (PD1500A) to deliver reliable, repeatable measurements of wide-bandgap (WBG) semiconductors, while ensuring the safety of the measurement hardware and the professionals performing the tests.

Fully characterising a SiC or GaN device requires static and dynamic measurements. Keysight's B1505A and B1506A Power Device analysers deliver these static measurements and, with the addition of the new PD1500A, now also provides the flexibility needed to address a variety of dynamic measurements. This functionality is key since the standards for WBG devices, established by the Joint Electron Device Engineering Council (JEDEC), continue to evolve. JEDEC is a semiconductor trade and engineering standardisation organisation.

Keysight's PD1500A is designed to be modular, allowing many device types to be tested and different characterisation tests to be performed at a variety of power levels. The initial system provides complete double-pulse test characterisation and parameter extraction for Si and SiC power semiconductors with ratings up to 1.2 kV and 200 A. Additional modules will be added to the PD1500A in the future to perform tests on devices requiring more current, such as GaN and power modules.

“To safely and consistently make the switch to innovative power devices, the automotive e-mobility ecosystem needs to evolve past using homegrown dynamic testing systems, which can be unreliable with non-warranted performance and characteristics,” stated Siegfried Gross, vice president and general manager of Keysight's Automotive and Energy Solutions Group.

“Keysight worked closely with semiconductor manufacturers, as well as designers in the energy and EV industries, to deliver a dynamic power device analyser platform that includes the essential double-pulse test measurement capability to achieve repeatable, reliable and safe dynamic power device characterisation.”

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